K. E., Käding, O. W., Rösler, M., and Zachai, R., Thermo reflectance Goodson, Experimental investigation of thermal conduction normal to diamond-silicon boundaries," Journal of Applied Physics, Vol. 77, pp. 1385-1392, 1995. CrossRef | |
Goodson, K. E., and Flik, M. I., "Solid layer thermal-conductivity measurement techniques," Applied Mechanics Reviews, Vol. 47, pp. 101-112, 1994. CrossRef | |
Cahill, D. G. et al, "Heat transport in thin films and at interfaces," Microscale Thermophysical Engineering, Vol. 1, pp. 85-109, 1997. CrossRef | |
Volklein, G., and Starz, T., "Thermal conductivity of thin films-experimental methods and theoretical interpretation," Proceedings of the 16th International conference on Thermoelectrics, ICT '97, pp. 711-718, 1997. | |
Woo Chul Kim, "Thermal transport in nano structured materials" Ph.D thesis, University of California, Berkeley, 2005. | |
Scott Thomas Huxtable, "Heat transport in super lattices and nanowires arrays" Ph.D thesis, University of California, Berkeley, 2002. | |
D. G. Cahill, "Thermal conductivity measurement from 30 K To 750 K: The 3 ω method," Review of Scientific Instruments, vol. 61, pp. 802-808, 1990. CrossRef | |
Yu, X. Y., Zhang, L., and Chen, G., "Thermal-wave measurements of thin-film thermal diffusivity with different laser beam configurations," Review of Scientific Instruments, Vol. 67, pp. 2312-2316, 1996. CrossRef | |
Chien HC, Yao DJ, Huang MJ and Chang TY, "Thermal conductivity measurement and interface thermal resistance using SiO2 thin film", Review of Scientific Instruments, vol. 79, 2008. | |
Chris Dames, "Measuring the thermal conductivity of thin films: 3 omega and related electrothermal methods", University of California, Berkeley, 2012. | |
1 omega, 2 omega, and 3 omega methods for measurements of thermal properties Chris Dames and Gang Chen, Rev. Sci. Instrum. 76, 124902 (2005), DOI:10.1063/1.2130718 | |
Kline, S. J., and McClintock, F. A, "Describing uncertainties in single-sample experiments", Mechanical Engineering, Vol. 75, pp. 3-8, 1953. |
Thermal Conductivity and Thermal Interface Resistance Measurements of Thin Films using 3ω Method
Samskar KuthatiRelated information
1 Department of Mechanical Engineering, Indian Institute of Technology Madras, Chennai 600036, India
, Arvind PattamattaRelated information1 Department of Mechanical Engineering, Indian Institute of Technology Madras, Chennai 600036, India